Mealey's (December 19, 2018, 1:39 PM EST) -- WILMINGTON, Del. — A patent directed to the testing of semiconductor chips was declared invalid on Dec. 18 by a Delaware federal judge, who found that the patent claims the abstract idea of “generating, receiving, analyzing by means of statistics, and reporting data” (In-Depth Test LLC v. Maxim Integrated Products Inc., No. 14-887; In-Depth Test LLC v. Vishay Intertechnology Inc., et al., No. 14-888, D. Del., 2018 U.S. Dist. LEXIS 212626)....