Federal Circuit: Fact Issues Remain In Dispute Over Patent Validity

(August 23, 2016, 12:45 PM EDT) -- WASHINGTON, D.C. — A Delaware federal judge’s decision to invalidate a semiconductor wafer patent as anticipated was vacated and remanded Aug. 19 by the Federal Circuit U.S. Court of Appeals, which cited the existence of genuine issues of material fact that should have precluded summary judgment (Semcon Tech LLC v. Micron Technology Inc., No. 15-1936, Fed. Cir.; 2016 U.S. App. LEXIS 15233).

(Decision available. Document #16-160906-015Z.)

The appellate panel of Circuit Judges Sharon Prost, William C. Bryson and Kara F. Stoll stopped short of directing U.S....
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